Atomic Force Microscope

Atomic force microscopy (AFM) imaging maps ceramics and composites on the nanoscale, providing topography and material properties. Because surface topology often does not reflect material differences, advanced imaging modes are applied to acquire data corresponding to relevant properties. For example, piezoresponse force microscopy (PFM) mode uses the phase signal from the applied voltage to map piezoelectric domains. 

The Nano-Observer AFM is equipped for all main imaging modes, including PFM. Designed for advanced imaging modes to maximize performance, multiple images can be obtained at the same AFM tip location. The Nano-Observer AFM is well-suited for ceramic and composite material characterization, providing high resolution imaging for a variety of samples.




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