Fiber Characterization Products

At Nanoscience Instruments, we strive to match customer needs for fiber research, development and quality control with the right instrumentation.

Scanning electron microscopy provides a high depth of field with image contrast for fiber materials. The Phenom SEM offers automated analysis with statistically significant data and no operator bias. Using EDS, elements in fibers, filters or coatings can be identified.

Atomic force microscopy images fibers and coatings on the nanoscale, measuring surface roughness or nanofiber dimensions.

Optical profilometry with proprietary focusing technology shows an infinite field of view for 2D imaging. Surface roughness and dimensional data are quickly ascertained with 3D imaging and analysis.


Related Pages

SEM for Fiber Applications
SEM for Fiber Applications

Advantages of using SEM to visually characterize fibers plus elemental analysis to identify materials

Atomic Force Microscopy of Fibers
Atomic Force Microscopy of Fibers

Characterize advanced textiles, nanofibers and nanocomposites using AFM

Imaging and Metrology of Fibers
Imaging and Metrology of Fibers

Visual characterization, metrology and surface roughness of fiber materials