Products for Pharmaceutical Materials Characterization
At Nanoscience Instruments, we strive to match customer needs with the right instrumentation to characterize pharmaceutical materials for research, formulation, and quality control.
Scanning electron microscopy can quickly determine particle morphology and distribution. Coupled with elemental analysis, material identification correlated to sample location is a readily acquired.
Surface roughness for tablet surfaces and coatings are measured with 3D optical profilometry or atomic force microscopy. For a large field of view, the Zeta-20 optical profiler will measure surface roughness in 30 seconds. For higher resolution with scan sizes in the nanometers, atomic force microscopy (AFM) is ideal. Additionally, particle interactions can be characterized using an AFM probe modified with a pharmaceutical particle.
SEM for Pharmaceutical Applications
Scanning electron microscope for analyzing pharmaceutical particles and identifying elements
Zeta 3D Optical Profiler for Pharmaceutical Applications
Non-destructive imaging of pharmaceutical coatings and materials
AFM for Pharmaceutical Applications
High resolution imaging and material characterization of pharmaceutical particles and coatings