Particle Surface Morphology

Pharmaceutical particle morphology can impact processing. Scanning electron microscopy (SEM) with automated analysis can provide statistical data. 

Individual particles can be examined with very high resolution for a closer look. Use an atomic force microscope to zoom in and examine particle surface roughness or morphology. With advanced imaging modes, material properties can also be investigated.

SEM and AFM of silica spheres

Phenom SEM image (left) and atomic force microscope images (right) of pharmaceutical particles