Instruments to Evaluate Thin Films & Coatings

At Nanoscience Instruments, we strive to match customer needs with the right instrumentation to measure, analyze, and optimize thin films and coatings.

Mechanical properties of thin films required dynamic nanoindentation for accurate and reliable data with no substrate effects. 

Laser-ablated thin films and coatings are quickly characterized with 3D optical profilometry

Thin film development to optimize structure with processing for desired properties benefits from scanning electron microscopy with EDS for elemental analysis.

Atomic force microscopy characterizes monolayers, bilayers and thin films on the nanoscale.

Dynamic Nanoindentation
Dynamic Nanoindentation

Accurate and reliable mechanical properties with no substrate effect

Optical Profilometer
Optical Profilometer

3D imaging and analysis of thin films and coatings

Scanning Electron Microscope
Scanning Electron Microscope

Optimize thin film R&D with SEM and EDS for elemental analysis

Atomic Force Microscope
Atomic Force Microscope

Nanoscale 3D imaging of monolayers and thin films