Share This

Filtration 2016

Visit Booth 520 at Filtration 2016 and test drive the fastest scanning electron microscope - the Phenom SEM!

Read more: Benefits of the Phenom SEM for filtration

Phenom ProX scanning electron microsope

Phenom ProX scanning electron microsope with EDS for elemental analysis

Ask about fast automated fiber analysis or elemental identification of filtration media. 

When: November 9th and 10th

Wednesday from 10:30 am - 5:30 pm

Thursday from 10:30 am - 3:00 pm

Where: Pennsylvania Convention Center - 1101 Arch Street - Philadelphia, PA

INDA_member_badge-Stacked