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MRS Spring 2016

Demo a Phenom SEM on-site!

Phenom ProX scanning electron microsopeJoin us at Booth 228 for the Materials Research Society spring meeitng, now in Phoenix, AZ for the first time! Test drive a Phenom ProX scanning electron microscope (SEM) on-site. 

Stop by to ask about our atomic force microscopes (AFM), 3D Optical Profilers for fast metrology measurements, nanoindenter systems and Micromechanical Testing Assembly systems. We also offer a variety of standard and specialized AFM probes.

NEW: Correlative Microscopy in-SEM products for Materials and Life Sciences.

MRS 2016 EXHIBIT HOURS

Tuesday March 29, 2016   9:30 AM - 7:00 PM

Wednesday March 30, 2016   11:00 AM - 5:30 PM

Thursday March 31, 2016   11:00 AM - 1:30 PM

Phoenix Convention Center
100 North 3rd Street
Phoenix, Arizona 85004

Please fill in our survey below to indicate your product interest for our booth display!


 SEM
 AFM
 Optical Profilometry
 Mechanical Characterization
 CLEM
 In-SEM cathodoluminescence
 Tuesday
 Wednesday
 Thursday
 

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