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Nanoindentation e-Seminar | May 24

Instrumented Indentation - Session 11: Statistical Analysis of Measurements

An e-seminar series from Nanomechanics

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Session 11: Statistical Analysis of Measurements

Wednesday, May 24, 2017

12:00pm, Eastern Time

Duration: 1 hour

Abstract:
How different do two measurements have to be in order for the difference to be statistically significant? This question is certainly not unique to instrumented indentation testing, but the means for answering must be available to practitioners of instrumented indentation. In this session, we review the student’s t-test for assessing significant difference in observation sets and its implications for experimental design.

Who Should Attend and Why?
Anyone responsible for or interested in nanoindentation should attend to quickly gain a comprehensive understanding of the test method and what it can do. Process engineers, test engineers and graduate students will achieve theoretical and practical knowledge about contact mechanics, the Oliver-Pharr method, dynamic indentation, thin-film modeling, and best practice.

 

Click here to register

 

About the series
Instrumented indentation, also called nanoindentation, has developed over the last three decades as the technique of choice for measuring the mechanical properties of thin films and other small volumes of material.  This instructional e-seminar, held monthly, covers all aspects of instrumented indentation, from overarching concepts to practical aspects of implementation. 

The first session explains why materials behave differently at the nanoscale, and provides an elementary introduction to instrumented indentation and its benefits.  Subsequent sessions teach contact mechanics, the Oliver – Pharr method, dynamic indentation, and thin-film modeling.  Theory is applied to a variety of common applications for instrumented indentation, including low-k films, hard coatings, polymers, and small structures.  Attendees are invited to suggest topics for future sessions.

Presenter Information:
Jennifer Hay is a senior applications engineer with Nanomechanics, Inc., a company which designs and produces advanced nano-scale metrology products, including turnkey nano-indenters, modular devices for nano-scale actuation and sensing, and contract testing. Mrs. Hay holds a masters’ degree in Mechanical Engineering from the University of Houston and has worked in the field of nano-indentation since 1996, advancing standardization while also developing methodology for new applications including thin films, anelastic metals, polymers, gels, and biomaterials. Mrs. Hay presently serves as the vice-chair for the MEMS/Nanomechanics technical division of the Society of Experimental Mechanics. In addition to many journal articles and conference papers, she has authored five invited journal articles on the theory and practice of instrumented indentation.