Large Radius Tip AFM Probes
These tips offer a defined, large radius, hemispherical tip shape that can be used, for example, for step height measurements over large scan areas.
SS-ISC Super Sharp Improved Super Cone Tapping Modeand Force Modulation Mode Probes
Super Sharp AFM probes provide enhanced resolution imaging. The SS-ISC probes are available in tapping and force modulation mode.
AFM Calibration Grids
Our new grids provide 100% Coverage. These grids permit calibration of an AFM scanner in all three dimensions.
Metal Needle AFM Probes
NaugaNeedles' probes are the first commercial metallic needle AFM tips. A combination of high aspect, consistent geometry, & high conductivity enables a wide range of new applications not previously possible.
All-diamond AFM Probes from ADT
NaDiaProbes® are the world's only all-diamond AFM probe, exclusively from Advanced Diamond Technologies. Benefiting from the unsurpassed hardness of diamond, they will outlast standard silicon probes by more than 100 times when imaging hard surfaces.
New AFM Wafer form factor
The new AppNano wafer makes removal of AFM chips easier than ever. The new scaffolding design gives better access to the back of the chip, reducing damage and droppage.
