The ResiScope system for the Nano-Observer atomic force microscope (AFM) is an award-winning instrument for electrical characterization. Resistance measurements ranging over 10 orders of magnitude (from 102 Ohms to 1012 Ohms) can be performed with the ResiScope. Resistance, log R, current and I/V spectroscopy data can be acquired and displayed.
Resistance data using the ResiScope for electrical characterization of an oxide film grown on stainless steel in high temperature water
Designed for versatility, multiple modes may be performed at the same AFM tip location with no reduction in scan speed. The ResiScope is compatible with several AFM imaging modes, including Contact, Lateral Force Microscopy (LFM), Oscillating (Tapping), Electric Force Microscopy (EFM), Magnetic Force Microscopy (MFM), and High Definition single-pass Kelvin Probe Force Microscopy (HD KFM).
ResiScope mode can be done in contact or oscillating mode. When using the intermittent contact mode, there is no friction and the tip is held at a constant force so soft samples can be quantitatively measured.
Schematic for ResiScope mode with Nano-Observer AFM