Other systems have limitations of electrical AFM measurements that include friction interference, lack of quantitative measurements, difficulties measuring soft materials and limited resistance range. These drawbacks are resolved with the ResiScope module for the Nano-Observer AFM. The ResiScope has a large dynamic range covering 10 orders of magnitude for resistivity and can provide quantitative resistance and current measurements on many different materials.
Soft ResiScope Resistance AFM image of organic solar cell, scan size 3 microns
Soft polymers like those used for organic solar cells can be characterized using the Soft ResiScope mode for quantitative resistance measurements of compliant samples. The Soft ResiScope mode uses a semi-oscillating technique to eliminate friction or damage to the sample. Concurrent operation of the Nano-Observer AFM with the ResiScope provides simultaneous imaging and material property measurements.
The Soft ResiScope mode:
- Is for soft, compliant or fragile (susceptible to current-induced damage) samples
- Has no friction
- Uses constant force to provide quantitative measurements