Nano-Observer AFM Modes

Imaging Modes with the Nano-Observer

A full suite of modes is available to measure many different properties at the nanoscale. 

  • Contact Mode
    • Surface topography 
  • Lateral Force Mode 
    • Frictional forces
  • Tapping (Oscillating, Intermittant contact) Mode
    • Surface topography with an oscillating tip to reduce lateral forces
  • Force Modulation Mode
    • Surface stiffness
  • Electric Force Microscopy (EFM)
    • Electrostatic domains
  • Kelvin Probe Force Microscopy (KFM)
    • Surface potential
  • Magnetic Force Microscopy (MFM)
    • Magnetic domains
  • Piezoresponse Force Microscopy (PFM)
    • Piezoelectric properties 
  • Conductive AFM (CAFM, also Scanning Spreading Resistance - SSR)
    • Conductivity or Resistivity 

 Inquire with one of our scientists to determine which modes are suitable for your application.