Nano-Observer AFM Options
Expand the capabilities of the Nano-Observer atomic force microscope with these options!
ResiScope for the Nano-Observer AFM
The ResiScope is an award-winning innovative instrument for resistance AFM imaging over 10 orders of magnitude. Combining the Nano-Observer AFM, a conductive tip, and the ResiScope, the electrical properties of a surface can be measured on the nanoscale.
Thermal Analysis Module
Thermal analysis on a nanoscale can be achieved with the Thermal Analysis module for the Nano-Observer AFM. Using a customized support for an AFM probe, a nanoscale thermo-mechanical analysis experiment can be performed on a sample as the deflection is monitored as a function of temperature.
Temperature Control Stage
Image processes like polymer crystallization as a function of temperature with the Temperature Control stage for the Nano-Observer AFM. Temperature can be ramped from ambient to 200 degrees C (392 degrees F).
Liquid Tip Holder
Imaging may be done in fluids using a liquid tip holder designed for the Nano-Observer AFM. Great for biological or materials science applications.
Schematic of liquid cell for Nano-Observer AFM
Environmental Control Stage
Use the Environmental Control to introduce gases or control the humidity while imaging with the Nano-Observer AFM. Environmental control may also prevent contamination and improve the electrical characterization measurement stability.