Nano-Observer AFM Specifications

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AFM Specifications

Z range: 9 µm (tolerance +/- 10%)
XY drive resolution: 24 bit control - 0.06 Angstroms
Z drive resolution: 24 bit control - 0.006 Angstroms
Z noise level: < 0.05 nm RMS 

AFM Modes (standard)

Contact Mode with Lateral Force Mode (LFM)
Oscillating Mode with Phase imaging
Force Modulation (FMM)

AFM Modes (Advanced, optional)

Electric Force Microscopy (EFM)
Kelvin Probe Force Microscopy (KFM)
ResiScope Resistance Imaging
Magnetic Force Microscopy (MFM)
Piezoresponse Force Microscopy (PFM)
Conductive AFM
Scanning Tunneling Microscopy (STM)


6 DAC Outputs: 6 D/A Converters – 24 bit
8 ADC Inputs: 8 A/D Converters – 16 bit
Data points: Up to 4096
Built-in Lock-in: Up to 1 MHz

ResiScope Specifications 

Resistance Range: 102 Ω to 1012 Ω
Current Range: 100 fA to 1 mA
Compatible AFM Modes: Contact, Oscillating /AC mode, EFM, MFM, KFM single-pass