Nanoscience Instruments is proud to partner with Nanomechanics, offering innovative and high performance nanoindenters to evaluate and understand the mechanical performance of materials on micro and nano scales.
Designed by industry pioneer Warren Oliver, the iMicro and iNano are high-performance, low-cost nanoindentation systems that provide fast, accurate, and repeatable mechanical property data with high spatial resolution. Several key features contribute to their best-in-industry performance:
Engineered to provide an unrivaled dynamic performance, the iMicro and iNano were also created to be accessible to users from the novice to a high level of expertise. With a time constant of 20 µs, these systems from Nanomechanics are the only commercial nanoindenters to simultaneously meet specifications for:
- Displacement range
- Digital resolution
- Noise floor
- Drift rate
Other systems must sacrifice one or more of these parameters to meet this resolution. Only the iMicro and iNano achieve these specifications concurrently.
The iMicro and iNano indenters are engineered with electromagnetic actuation for linear force control. This allows force and displacement to be independent variables to maximize accuracy and precision. In contrast to other types of actuators, electromagnetic actuation does not require a feedback system to achieve specified loading conditions. Linear force control also provides an uncomplicated calibration.
Load frame stiffness is an indentation parameter that can significantly impact data yet the magnitude of its effect is often unrealized. The load frame stiffness needs to be determined and the applied correction must be a small fraction of the total displacement. The iMicro and iNano have high load frame stiffness to yield data with a high level of accuracy.
Built to be robust and dependable, these nanoindenters will endure for test after test to provide the most accurate data available. With an industrial aluminum gantry, capable high force actuator and reliable software, iMicro and iNano are designed for maximum uptime, high accuracy experiments and long-term repeatability.
Often referred to as Continuous Stiffness Measurements (CSM), dynamic nanoindentation is a progression of traditional microhardness testing. During an automated indentation test, the force and penetration are measured during the entire time of applying force. High speed measurements can be acquired and analyzed without images of indents, resulting in no operator bias using nanoindentation techniques.
The thin film test method uses a substrate correction for accurate data. The thin film method is for films less than 100 nm that are influenced by substrate mechanical properties. The iNano is ideally suited for this application.
The iNano and iMicro systems are available with high precision scratch and wear testing. These are critical techniques when applications require contact and motion between two materials, for example to measure interactions between brake pads, ball bearings or machine engine components. The Nanomechanics systems use ultra-high resolution nanoindenters to yield quantitative scratch results. Capabilities for metals, ceramics, polymers, composites and films include characterizing scratch hardness, mar resistance, coating adhesion, failure modes, and film delamination. The scratch kit includes a testing method and diamond indenter tip. Use our sidebar form to request more information.
Using a proprietary technique termed NanoBlitz, the iMicro and iNano offer unprecedented and unrivaled dynamic testing with high accuracy, precision and speed. With 3D testing, properties such as elastic modulus, hardness, and stiffness at a specific load for each indent in an array are acquired, typically at a speed of 1 second per indentation. NanoBlitz uses a constant strain rate method to map mechanical properties with statistical significance.
Applying a sophisticated constant strain rate method, NanoBlitz 4D property maps of hardness, modulus and stiffness along with topography as a function of depth are acquired. These measurements are at high speeds, with less than 3.5 seconds per indentation. The 4D method is well-suited for layered or structured materials, as shown here for a microelectronic sample: