The Zeta-20 3D optical profiler system offers high performance 3D metrology and imaging for non-contact quantitative sub-micron surface analysis:
The Zeta-203D system has fast, true-color 3D imaging in less than 30 seconds with a large range, to the millimeter scale features and field of view. With patented focusing z-dot technology, imaging contrast is generated independent of the sample to provide high resolution height measurements through infinitely focused 2D images.
Zeta 3D metrology systems have greater light throughput than confocal microscopes, interferometers or other optical profilers. Because of high light throughput and proprietary design, Zeta 3D optical profilers are inherently insensitive to vibration and sample tilt.
Zeta 3D optical profiler image of patterned sapphire substrate (PSS)
Applying advanced and innovative 3D imaging and measuring technology, the Zeta optical profiler meets the needs of challenging surface analysis. The Zeta 3D systems are ideal for analyzing complex surfaces such as: