Phenom Scanning Electron Microscope
Phenom Pro/ProX Desktop SEM
The Phenom Pro and ProX desktop SEMs are high-performance SEMs for the ultimate all-in-one imaging and X-ray analysis systems. A unique and powerful core architecture combines with a host of hardware and software features to provide the most complete desktop SEM solution on the market. Phenom SEMs are equipped with a high brightness Cerium Hexaboride (CeB6) source, allowing for better image resolution through the range of accelerating voltages and a longer source lifetime compared to tungsten sources.
Superior Imaging
High brightness, long lifetime CeB6 source
Fastest SEM Available
30 seconds from loading to electron imaging
Ease of Use
Designed for both new and experienced users
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All-in-one imaging system for any application
The Phenom Pro desktop SEM is optimized to be the ultimate all-in-one imaging system for any application. For those wanting X-ray elemental analyses, the Phenom ProX comes with a fully integrated EDS detector. This analysis is fully integrated into an updated user interface, which allows for seamless operation for both new and experienced users. Upgrading your Pro model to the ProX can be easily performed on site.
Phenom Pro/ProX Desktop SEM
Product Features
Cerium Hexaboride Crystal Electron Source
Cerium hexaboride (CeB6) crystals, used as thermionic electron sources, deliver superior image quality with sharper resolution and enhanced contrast. These robust electron sources are more durable than traditional tungsten filaments, lasting over 30 times longer. Unlike tungsten filaments, these sources are not susceptible to catastrophic failures and degrades gradually. This enables the users to schedule replacement of the source as part of routine maintenance
Proven Ease-of-Use Operation
Live SEM images, an optical overview, clean menus, and straightforward controls culminate into an accessible and intuitive, friendly user experience.
Flexible Integration & Minimal Footprint
Phenom Desktop SEMs are designed to deliver the capabilities of larger SEMs in a more compact and versatile form. Their streamlined design allows them to fit seamlessly into any workspace, whether on a surface or tabletop. With built-in vibrational stability, the Phenom offers a highly durable and robust SEM solution suitable for a wide range of applications.
Four-Segment Backscattered Electron Detector (BSD)
The four-segmented backscattered electron detector (BSD) delivers sharp compositional contrast between light and heavy elements. Included as a standard feature in every Phenom system, it also offers topographic modes for qualitative visualization of surface roughness, enhancing surface detail and material differentiation.
Secondary Electron Detector (SED)
Secondary Electron Detectors (SED) are perfect for high-resolution, surface-sensitive SEM imaging, providing detailed topographical information through secondary electron emissions. This allows for crisp visualization of fine surface features. With an SED, Phenom users can also activate a mixed mode, combining both SED and BSD signals at a customizable ratio for comprehensive imaging analysis.
Energy Dispersive X-ray Spectroscopy Detector (EDS)
Energy Dispersive X-Ray Spectroscopy (EDS) detectors are fully integrated into Phenom SEMs, enabling efficient quantitative surface chemistry analysis. EDS provides rapid and precise results across multiple analysis modes, including regions, points, and lines, making it a versatile tool for a wide range of applications.
Phenom Pro/ProX Desktop SEM
Accessories
Motorized Tilt & Rotate Sample Holder
Revealing the hidden features of samples is made possible with the Motorized Tilt & Rotation sample holder. This holder allows for angular tilting and rotation of the sample stage, allowing for imaging of the same area from multiple angles and improved visualization of three-dimensional structures.
Microtool Sample Holder
The Microtool Sample Holder features an iris style clamp, specially designed for securely holding axially shaped objects or samples with a high aspect ratio. Ideal for observing drill bits, milling tools, and injection needles, simply secure the sample with a non-destructive clamping mechanism and start imaging within minutes.
Charge Reduction Sample Holder
The Charge Reduction Sample Holders effectively reduces electric charge buildup, minimizing the amount of preparation needed to analyze nonconductive samples. Paper, polymers, organic materials, ceramics, glass, and coatings are but a few of the materials accommodated by these holders.
Temperature Controlled Sample Holder
The Temperature Controlled Sample Holder protects sensitive specimens and enables imaging of hydrated samples by Peltier cooling and heating. With a temperature range of -25°C to 50°C, samples can be maintained at sub-zero temperatures to prevent damage from the vacuum and electron beam.
Electrical Feedthrough Sample Holder
The Electrical Feedthrough Sample Holder enables in-situ electrical measurements. The holder has six quick release pins that can be used to measure or apply voltages and currents to the sample while it is under the SEM column. This holder is ideal for observation of MEMS devices and for performing failure analysis.
Metallurgical Sample Holder
The Metallurgical Sample Holder is designed to support resin-embedded samples. It comes in two variations – standard and charge reduction, with the option for two sizes of inserts. This holder speeds up SEM analysis for metallurgical samples.
Phenom Pro/ProX Desktop SEM
Software
Phenom Prosuite Software
ProSuite Software, developed specifically for Phenom SEMs, enhances data throughput and eliminates user bias from manual measurements, ensuring more accurate and reliable results. It can extract actionable data on the size and shape of features in SEM images.
MAPS
ChemiSEM / ChemiPhase
Streamline elemental and phase analysis with integrated data collection and advanced analysis capabilities. ChemiSEM provides real-time elemental mapping during live imaging and ChemiPhase transforms EDS maps into color-coded phase maps.
Phenom Pro/ProX Desktop SEM
SEM Sample Preparation
Sputter Coaters
Minimize electric charging and enhance SEM image quality with uniform gold and platinum coatings.
Ion Mills
Prepare artifact-free samples for high quality cross-sectional analysis. Especially useful for EBSD and failure analysis.
Nebula Particle Disperser
The Nebula is designed to assist in dispersing powder samples, facilitating their preparation for SEM analysis.
Phenom Pro/ProX Desktop SEM
Product Knowledgebase
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