Compare Profilometer Technology

Pattern Projection combined with Focus Detection is generally faster than the other scanning techniques because only Z motion is required.  This method also improves height resolution to be comparable or better than scanning techniques. This method is incorporated into Zeta 3D ZDot focusing technology, using a confocal grid structured array illumination (CGSI) to measure almost any surface.

Pattern Projection compares a projected known pattern to the reflected pattern.

Focus Detection provides 3D imaging at lower resolution than confocal or interferometry.

Interferometry uses an interference fringe and is best suited for smooth, reflective surfaces. Interferometry has a large field of view (FOV) but is sensitive to vibrations. 

Confocal microscopy can be slow and sensitive to vibration. Confocal laser scanning microscopy may require a trained operator and periodic calibration. Because the source is a laser, imaging artifacts are possible and 3D data is false color. 

Pattern Projection with Focus Detection
Pattern Projection with Focus Detection

Combination of pattern projection and focus detection

Pattern Projection
Pattern Projection

Differences in projected patterns generate 3D images

Focus Detection
Focus Detection

Create 3D images using focal planes

Interferometry
Interferometry

Principles and schematic of interferometry

Confocal Profilometry
Confocal Profilometry

Principles and schematic of confocal profilometry


Technology

Contact Us: 480-758-5400


 

Captcha Code

Click the image to see another captcha.