Aluminum oxide SED image at 50000x using Phenom XL SEM
A secondary electron detector (SED) for scanning electron microscopy offers images with resolution independent of the material. An SED image uses the inelastically-scattered electrons close to the sample surface for topographical information.
An SED option is available for the Phenom XL SEM for large or multiple samples. The SED is fully integrated in the Phenom XL for detailed sample surface topography.