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2024 NanoNews: SEM Edition Q3

We’re pleased to share the latest edition of nanoNews! In the third quarter newsletter, you’ll find our webinar resources, event news, and our newest articles and technical notes — all focused on Scanning Electron Microscopy (SEM).

NEWS & UPDATES

MAPS

MAPS is a unique software feature that lets users correlate data from various imaging techniques. It also features the ability for large area EDS analysis, high resolution SEM image stitching, and multimodal workflows.

Learn More

SEMPREP SMART

SEMPrep SMART is a state-of-the-art multifunctional ion milling system for slope cutting and damage-free surface polishing that is vital for SEM and EBSD sample preparation.

Learn More

CONFERENCE CORNER

UPCOMING EVENTS:

The Battery Show 2024

Nanoscience Instruments provides solutions for battery development applications through state-of-the-art instrumentation and analytical services. Stop by our booth for live demonstrations of desktop SEM with automated workflows designed for structural and chemical analysis of battery materials, and learn about our surface characterization tools, battery cyclers & potentiostats, and process development and analytical services.

Learn More About Battery Show ’24

ISTFA 2024

Visit our booth at the International Symposium for Testing and Failure Analysis to discover how our cutting-edge microscopy solutions can elevate your material analysis. Get hands-on with the best-selling Phenom Desktop SEM, featuring ChemiSEM technology that allows you to simultaneously visualize sample morphology and elemental distribution for rapid, actionable insights.

Learn More About ISTFA ’24

WEBINARS

Coming Up Soon:

Advancing Battery Technology with SEM/EDS: Optimizing Quality and Performance

Date: October 22, 2024
Time: 1 PM ET

As the world shifts towards electric vehicles and renewable energy, understanding and improving battery materials is more crucial than ever for enhancing performance and…

Register Today
Enhancing Cryo-TEM Efficiency: Screening Negatively Stained Samples with Desktop STEM

Date: October 29, 2024
Time: 1 PM ET

In this webinar, we will introduce the Phenom Pharos and demonstrate how it can either replace an aging TEM or bring negative stain capabilities to your lab…

Register Today

Available On Demand:

Enhancing Elemental Analysis with Real-Time Mapping: Phase Identification Using ChemiSEM & Phase Mapping

Elemental analysis is a crucial aspect of material characterization, but traditional methods can be time-consuming and complex. ChemiSEM revolutionizes this process by utilizing machine learning and ultrafast signal processing to …

Watch On Demand

TECH NOTES & BLOGS

TECH NOTE
Phenom Pharos: A Compact Desktop STEM for Screening Negative Stained Samples

The Phenom Pharos Desktop SEM/STEM is a compact and affordable solution designed for cryo-electron microscopy groups and core facilities looking to streamline experimental workflows. This technical note evaluates the Phenom Pharos’ performance in imaging negatively stained samples, demonstrating its effectiveness as an alternative to aging room temperature TEMs.

Learn More
TECH NOTE
Automated SEM/EDS Monitoring of Steel Inclusions for Compliance with ASTM Standards

In modern steel manufacturing, non-metallic inclusions represent a critical quality concern due to their effects on mechanical properties and overall steel functionality. Scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDS) have immense value for the in-depth analysis of these inclusions, offering higher resolution and compositional data over traditional optical methods.

Learn More

BLOGS:

Pristine Cross-Section Polishing in Material Analysis 

In material science, cross-section polishing is a critical method to enable the detailed examination of a sample material’s microstructure. This technique is essential for understanding the composition, properties, and potential …

Read More
Why EDS Matters: The Role of Energy Dispersive X-ray Spectroscopy in Materials Science 

Energy Dispersive X-ray Spectroscopy (EDS) is an analytical technique used for elemental analysis and chemical characterization of materials. By detecting and measuring the energy of X-rays emitted from a sample …

Read More
ChemiSEM: Simultaneous Acquisition of Morphological and Compositional Data 

In a scanning electron microscope (SEM) with Energy Dispersive X-ray Spectroscopy (EDS), a sample’s elemental composition is identified via the X-rays emitted during the electron beam interactions. Typically, acquiring compositional …

Read More
The Significance of Beam Intensity in Scanning Electron Microscopy (SEM) Imaging 

Scanning Electron Microscopy (SEM) is an indispensable tool in various scientific and industrial fields, providing high-resolution images of sample surfaces. Among the numerous parameters that influence SEM imaging, beam intensity …

Read More
ChemiPhase for Efficient Mapping of Mineral Phases in Geological Samples 

Geological samples are complex matrices of minerals, each with their own unique compositions and structures. Phase identification, in a general sense, is the process of highlighting these differences to better …

Read More
From Surface to Depth: How Accelerating Voltage Affects SEM Imaging 

Scanning Electron Microscopy (SEM) is a powerful imaging technique that allows for the observation of the surface details of a sample at very high magnifications. One of the key parameters …

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