SCANNING TRANSMISSION ELECTRON MICROSCOPY
Phenom Pharos Desktop STEM
The STEM Sample Holder adds a new dimension of imaging capabilities to the Phenom Pharos Desktop SEM, making application diversity even more accessible and expanding advanced imaging to all levels of microscopy expertise. A high-brightness field-emission source comes together with a fully integrated segmented STEM detector to generate transmission images with stunning contrast even at low voltages. This compact desktop STEM-in-SEM system delivers the precision and resolution of nanoscale imaging traditionally reserved for larger, floor model systems, all within the streamlined and intuitive Phenom platform.
Integrated STEM Detector
The STEM detector and electronics are seamlessly integrated into the sample holder, making the transition to STEM mode as simple as loading a sample.
Sub-Nanometer Resolution
Delivers sub-nanometer resolution, approaching the information limit essential for detailed imaging of biological samples like negatively stained proteins.
Expansive Imaging Area
A large detector pixel array offers a viewing area up to 200x larger (1.8 mm x 1.1 mm at minimum magnification) than traditional tabletop TEMs.
Talk to an Instrumentation Specialist Today!
Cost Effective Alternative to Traditional TEM
The Phenom Pharos Desktop STEM is the first of its kind, combining a dedicated STEM sample holder, an integrated detector, and a field emission source in a compact, user-friendly design. This innovative system excels in producing high contrast transmission electron micrographs at low voltages, making it particularly suited for imaging biological materials prepared with negative staining or ultrathin tissue sections. Compact and versatile, the system fits seamlessly into any lab setting. Additionally, in SEM mode, it can efficiently inspect TEM grids for film continuity and structural defects, offering a comprehensive solution for sample evaluation.
Phenom Pharos Desktop STEM
Product Features
Field emission gun
The high brightness of a Schottky field emission gun (FEG) delivers exceptional resolution across an accelerating voltage range of 1–20 kV. This makes the Pharos not only excel for STEM applications but also stand out with superior SEM imaging performance, especially for delicate samples. Its versatility ensures precise, high-quality results for a wide variety of research and industrial applications.
Integrated STEM Detector and Sample Holder
The sample holder features an integrated detector with 11 segments, offering presets for bright field (BF), dark field (DF), and high-angle annular dark field (HAADF), along with options for custom configurations. Its camera length is optimized for a wide range of applications, including life sciences. This smart design removes the need for cables, as the interface board automatically detects the STEM detector and adjusts to the available imaging conditions.
Easy sample loading
The sample chuck securely holds standard 3-mm TEM grids, which can be loaded into the detector in either orientation. Built for durability, the sample mount is designed to handle frequent sample exchanges and repeated loading and unloading cycles. The stub is optimized with a copper clamp that holds the grids in place, guaranteeing sample flatness and grid protection.
Time to image <40 seconds
After mounting the sample in the stub, the Phenom Desktop STEM fast pump down mechanism and user interface makes it possible to begin imaging in less than one minute. The UI automatically recognizes the STEM detector and instantaneously enables the STEM imaging pane. After selecting your preferred imaging conditions (BF, DF, or HAADF), the detector is read out accordingly and area of interest is imaged with the optimal signal-to-noise ratio.
Expansive imaging area
With the large pixel array detector, you can view nearly the entire sample grid at minimum magnification. This advanced feature offers 200 times more field of view compared to other TEM systems, making it a great solution for quickly screening grid quality and identifying areas of interest.
Proven Ease-of-Use Operation
Live SEM images, an optical overview, clean menus, and straightforward controls culminate into an accessible and intuitive, friendly user experience.
Flexible Integration & Minimal Footprint
Phenom Desktop SEMs are designed to deliver the capabilities of larger SEMs in a more compact and versatile form. Their streamlined design allows them to fit seamlessly into any workspace, whether on a surface or tabletop. With built-in vibrational stability, the Phenom offers a highly durable and robust SEM solution suitable for a wide range of applications.
Four-Segment Backscattered Electron Detector (BSD)
The four-segmented backscattered electron detector (BSD) delivers sharp compositional contrast between light and heavy elements. Included as a standard feature in every Phenom system, it also offers topographic modes for qualitative visualization of surface roughness, enhancing surface detail and material differentiation.
Secondary Electron Detector (SED)
Secondary Electron Detectors (SED) are perfect for high-resolution, surface-sensitive SEM imaging, providing detailed topographical information through secondary electron emissions. This allows for crisp visualization of fine surface features. With an SED, Phenom users can also activate a mixed mode, combining both SED and BSD signals at a customizable ratio for comprehensive imaging analysis.
Energy Dispersive X-ray Spectroscopy Detector (EDS)
Energy Dispersive X-Ray Spectroscopy (EDS) detectors are fully integrated into Phenom SEMs, enabling efficient quantitative surface chemistry analysis. EDS provides rapid and precise results across multiple analysis modes, including regions, points, and lines, making it a versatile tool for a wide range of applications.
Phenom Pharos Desktop STEM
Desktop STEM Applications
Negative stain electron microscopy
Transmission imaging enables precise analysis of negative stain samples, including particle size, homogeneity, and morphology, while also serving as a reliable pass/fail screening tool for cryo-EM preparation.
Pathology
The Phenom Pharos STEM delivers high-resolution imaging of organelles used in diagnostics, offering compatibility with existing sample preparation methods and user-friendly software to streamline and accelerate pathology workflows.
Grid inspection
Quickly inspect TEM grids using to ensure cleanliness and integrity, saving time and preventing wasted sample preparation on substandard grids.
Phenom Pharos Desktop STEM
Accessories
Motorized Tilt & Rotate Sample Holder
Revealing the hidden features of samples is made possible with the Motorized Tilt & Rotation sample holder. This holder allows for angular tilting and rotation of the sample stage, allowing for imaging of the same area from multiple angles and improved visualization of three-dimensional structures.
Microtool Sample Holder
The Microtool Sample Holder features an iris style clamp, specially designed for securely holding axially shaped objects or samples with a high aspect ratio. Ideal for observing drill bits, milling tools, and injection needles, simply secure the sample with a non-destructive clamping mechanism and start imaging within minutes.
Charge Reduction Sample Holder
The Charge Reduction Sample Holders effectively reduces electric charge buildup, minimizing the amount of preparation needed to analyze nonconductive samples. Paper, polymers, organic materials, ceramics, glass, and coatings are but a few of the materials accommodated by these holders.
Temperature Controlled Sample Holder
The Temperature Controlled Sample Holder protects sensitive specimens and enables imaging of hydrated samples by Peltier cooling and heating. With a temperature range of -25°C to 50°C, samples can be maintained at sub-zero temperatures to prevent damage from the vacuum and electron beam.
Electrical Feedthrough Sample Holder
The Electrical Feedthrough Sample Holder enables in-situ electrical measurements. The holder has six quick release pins that can be used to measure or apply voltages and currents to the sample while it is under the SEM column. This holder is ideal for observation of MEMS devices and for performing failure analysis.
Metallurgical Sample Holder
The Metallurgical Sample Holder is designed to support resin-embedded samples. It comes in two variations – standard and charge reduction, with the option for two sizes of inserts. This holder speeds up SEM analysis for metallurgical samples.
Phenom Pharos Desktop STEM
Product Knowledgebase
Webinar
Enhancing Cryo-TEM Efficiency: Screening Negatively Stained Samples with Desktop STEM
Negative Stain imaging is a critical step in the single-particle cryo-EM workflow, allowin…
Blog
Desktop STEM as a Sample Screening Tool for Cryo-EM
Sample preparation for cryogenic electron microscopy (cryo-EM) can be a demanding and expe…
White Paper
Phenom Pharos: A Compact Desktop STEM for Screening Negative Stained Samples
The Phenom Pharos Desktop SEM/STEM is a compact and affordable solution designed for cryo-…