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Nanoscience Blogs

Struck by an Electron Beam: Interactions at the Surface in SEM

Scanning Electron Microscopy (SEM) is one of the most important tools in the arsenal of modern material science used to characterize micro and nanoscale features….


Posted: June 19, 2024 | Technology: Scanning Electron Microscopy

Importance of Integrated EIS on Every Channel

Electrochemical Impedance Spectroscopy (EIS) is a powerful, non-destructive electrochemical technique used to probe electrochemical reactions by applying a small, alternating sinusoidal voltage to the device…


Posted: June 12, 2024 | Technology: Electrochemistry

From Photons to Electrons: Optical and Electron Microscopy 

Microscopy is a technique that allows us to visualize matter on length scales not visible to the human eye. Two of the most common microscopy…


Posted: June 5, 2024 | Technology:

Optical Tensiometry Solutions for Contact Angle Measurements on Challenging Samples 

Surface characterization plays a crucial role in various industries, from pharmaceuticals to electronics and beyond. Understanding how liquids interact with solid surfaces is essential for…


Posted: May 29, 2024 | Technology: Tensiometry

Improving Microstructural Analysis in SEM Imaging with Gamma Correction 

A scanning electron microscope (SEM) is capable of visualizing compositional heterogeneity on the surface of a sample by employing a backscattered electron detector (BSD). A…


Posted: May 22, 2024 | Technology: Scanning Electron Microscopy

Characterizing Organic Electrochemical Transistors for Bioelectronics using EQCM-D 

One of the most prevalent tools in the field of bioelectronics is the organic electrochemical transistor (OECT). Due to its mixed (ionic and electronic) conduction…


Posted: May 15, 2024 | Technology: Electrochemistry, QCM-D

SEM Imaging of Uncoated, Nonconductive Samples

Scanning Electron Microscopy (SEM) generates high-resolution images by scanning a focused beam of electrons across the sample surface and detecting the signals produced through beam-sample…


Posted: May 8, 2024 | Technology: Scanning Electron Microscopy

What is Technical Cleanliness? 

Technical cleanliness is an analytical standard to determine the level of particulate contamination on machined parts. The goal of technical cleanliness is to characterize the…


Posted: May 2, 2024 | Technology: Scanning Electron Microscopy

Exploring the Diverse Applications of Electrospraying 

Particles are being used in different industries including pharmaceuticals, agriculture, food science, cosmetics, and filtration for a wide variety of applications. Several techniques are commonly…


Posted: April 30, 2024 | Technology: Electrospinning & Electrospraying

How Does Coating Thickness Affect SEM Imaging? 

Charging is one of the most common issues when imaging non-conductive samples by scanning electron microscope (SEM) as it can distort images and damage the…


Posted: April 24, 2024 | Technology: Scanning Electron Microscopy

Gold vs Platinum: Choosing the Right Coating for SEM Imaging 

One of the most common challenges when analyzing non-conductive samples with a scanning electron microscope (SEM) is the charging effect. Without a conductive path, the…


Posted: April 18, 2024 | Technology: Scanning Electron Microscopy

How Does Resolution Affect the Performance of a Potentiostat?

A potentiostat is an electrochemical instrument used to control the potential difference between a working electrode and a reference electrode while measuring the resulting current….


Posted: April 16, 2024 | Technology: Electrochemistry

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