Combined QCM-D/ellipsometry setup for real-time characterization of thin molecular films

Several surface sensitive techniques are able to monitor the formation and properties of thin molecular films on a sensor surface. As the complexity of the studied systems increases, one technique alone can often not provide all desired insight. Multitechnique approaches provide complementary information, and thus allow for improved interpretation and/or the identification of artifacts. Comparing data from several separate experimental setups, however, is not always straight forward due to differences in the experimental conditions. Therefore, merging several techniques into the same setup and monitoring events on the same surface is a promising approach. This application note presents how a combined experimental setup of Quartz Crystal Microbalance with Dissipation Monitoring (QCM-D) and ellipsometry can augment the measurement of molecular behavior at a sensor surface.