The Phenom STEM (scanning transmission electron microscopy) detector enables transmission imaging modes for the Phenom Pharos Desktop SEM. STEM-in-SEM imaging offers increased visibility of sample morphology and reveals subsurface structural details at higher resolutions than conventional SEM. The small footprint and lower operating vacuum also provide a faster workflow compared to conventional STEM instruments for applications that do not demand atomic resolution imaging. This new imaging modality provides immense value to a variety of fields including materials science, biology, and cryo-EM sample preparation.
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