Characterizing internal structures using a surface analysis technique like scanning electron microscope (SEM) requires the preparation of a cross section of the sample. Cross-sectional sample prep involves generating a clean, precise slice through a material to expose its subsurface layers. Mechanical cutting or grinding methods are commonly used for cross section sample preparation. However, in many cases these methods damage or obscure the details that need to be observed resulting in inaccurate measurements and incorrect conclusions. Ion Milling, also known as cross section polishing, is a more advanced and refined technique that uses a beam of ionized inert gas, typically argon, to abrade the surface of a sample in an even and controlled manner. This process results in a clean, precise cross section wherein the integrity of the internal structures of a sample is preserved, and detailed analysis can therefore be conducted.