Masterclass Webinars
Phenom SEM Masterclass Series
The SEM Masterclass series focuses on comprehensive explorations into advanced SEM imaging and analysis. Guided by our SEM Application Scientists, these sessions provide a multitude of expert insights, tips, and knowledge while also offering interactive Q&As.
ON DEMAND
Session 1: Imaging Deep Dive
Abstract:
Join our comprehensive online masterclass designed to enhance your knowledge and skills in scanning electron microscopy (SEM). This course is ideal for researchers, technicians, professionals, and anyone interested in mastering the intricacies of SEM imaging.
Key Highlights of the Masterclass:
Understanding SEM Imaging Sources:
• Electron source dynamics, accelerating voltage, and beam intensities
• Beam shaping techniques for optimal imaging results
• Focus, stigmation, and source tilt
In-Depth Analysis of SEM Detectors:
• Physics of BSD and SED, their contrast mechanisms, and depth perception
• Nuances of SE1-SE2-SE3 in SED imaging
Overcoming SEM Imaging Challenges:
• Common issues like charging, image artifacts, and drifting
• Coating methods for non-conductive samples
• Low kV and low vacuum imaging techniques
Presentation By:
Ingrid Koch
Application Scientist
Nanoscience Instruments
Vince Pastore
Product Manager
Nanoscience Instruments
ON DEMAND
Session 2: Sample Prep Solutions
Abstract:
Our second SEM Masterclass is an opportunity to explore the art of sample preparation – one of the most critical steps in obtaining high quality micrographs. This session is designed to equip you with strategic insights and techniques to navigate the complexities of preparing diverse samples. Whether dealing with wet materials, beam-sensitive specimens, large objects, powders, or samples prone to charging, this masterclass will provide you with the knowledge to overcome these challenges effectively.
Key Highlights of the Masterclass:
Mitigating Charging Effects with Sputter Coating
• Physics behind coating
• Critical aspects of sputter rate and current regulation
• Argon gas
• Benefits and applications of Au/Pt coatings
Proper Particle Prep Methods
• Diverse methods such as flicking, dish, tap, drop casting, and colloidal graphite mounting
• Nebula Particle Dispersion device
Managing Beam-sensitive Samples
• How does coating help?
• Cold stages and critical point drying to preserve sample integrity
Handling Wet Materials
• Effective wet material prep with critical point drying
• Fixation and embedding samples in resin
Larger and Bulkier Samples
• Mechanical support through vises and resin embedding
Tilting
• Non-motorized and motorized tilting mechanisms
Presentation By:
Vince Pastore
Product Manager
Nanoscience Instruments
Ingrid Koch
Application Scientist
Nanoscience Instruments
ON DEMAND
Session 3: Automated Data Analysis
Abstract:
The third masterclass in our SEM series elevates your analytical capabilities by introducing you to the advanced automated data analysis features of the Phenom ProSuite, a collection of analytical software, focusing on sophisticated post-processing techniques and automated image mapping. This session is designed to enhance efficiency and precision in SEM applications, covering a broad spectrum of advanced features and workflows essential for modern microscopy professionals.
Key Highlights of the Masterclass:
Automated Image Mapping
• Large field of view while retaining high resolution
• Queue multiple areas and use saved positions
• Defining different shape areas
• Randomized SEM tiles for process control applications
• Area revisit and the Image Viewer
Particle Analysis with ParticleMetric
• Basic workflows
• Automated Image Mapping for image capture
• Inverted contrast
• Defining tuning and output parameters
• Post processing:
• D-values, removing outliers, separating populations using graphs, revisiting particles, graph settings
Fiber Analysis with FiberMetric
• Basic workflows
• Making fiber orientation graphs
• Colored orientation images
3D Roughness Reconstruction
• How does it work?
• Source of the algorithm
• Surface comparisons
• How small can you go?
Presentation By:
Ben Abraham
Product Manager
Nanoscience Instruments
Mitch Lightner
Application Scientist
Nanoscience Instruments
ON DEMAND
Session 4: Energy Dispersive X-ray Spectroscopy
Abstract:
This masterclass is a thorough exploration of energy dispersive X-ray spectroscopy (EDS) applied in SEM, tailored for individuals eager to deepen their understanding and skills in material characterization. Our class addresses both the theoretical underpinnings of EDS and its practical applications, focusing on real world challenges and data analysis beyond just conventional software tools.
Key Highlights of the Masterclass:
X-ray generation and spectral fitting
• Fundamental concepts including ZAF corrections and identifying artifacts
Analysis of non-ideal samples
• Strategies for tackling semi-quantitative analysis, shadowing, charging, and understanding time-sensitive parameters
Advanced data analysis
• Guidance on interpreting raw data, improving energy resolution, and employing NIST EDS tools
Hyperspectral mapping
Presentation By:
Ben Abraham
Product Manager
Nanoscience Instruments
Vince Pastore
Product Manager
Nanoscience Instruments
ON DEMAND
Session 5: Cross-Sectioning Prep & Ion Milling
Abstract:
Delve into the meticulous world of sample preparation for microscopic analysis in our dedicated cross-sectioning sample masterclass, emphasizing ion milling techniques. Designed for researchers, technicians, and anyone involved in material science and engineering, this course covers the end-to-end process of preparing cross sections. You will learn everything from mounting to achieving artifact-free finishes, suitable for a vast range of materials.
Key Highlights of the Masterclass:
Ion milling focus
• Explore why ion milling cross section polishing is a superior choice. Compare and contrast its effectiveness against other methods and learn how it produces artifact-free cross sections
Mounting cross sections
• Learn the art of 90° mounting and the nuances between mounting flat surfaces vs. curves or tubes, including tips on tilting
Cutting techniques
• Understand the importance of choosing between blades and scissors and how the cutting method can impact sample integrity
Freeze fracturing
• See what materials are best suited for this technique and understand its limitations
Resin embedding
• Master embedding resins and mechanical polishing to prepare hard material samples
Presentation By:
Dominic Dominguez
Application Scientist
Nanoscience Instruments
Michael Stoller
Application Scientist
Nanoscience Instruments
ON DEMAND
Session 6: Coding Python for the Phenom
Abstract:
With Python scripting, unlock the full potential of Phenom Desktop SEMs in this targeted masterclass. If you are interested in integrating automation and advanced imaging techniques into your microscopy workflows, this course is tailored to enhance your efficiency and expand your capabilities.
Key Highlights of the Masterclass:
Phenom Process Automation (PPA) Packages
• Learn about pre-existing scripts such as the Coating Inspector, Ultra Depth of Focus, and Smart Scan. See how these tools can elevate the quality and depth of your SEM analysis.
Phenom Programming Interface (PPI) – Basics
• Start from the ground up with image acquisition, automating basic imaging workflows, and incorporating other Python libraries for post-processing.
Advanced PPI with EDS Integration
• Explore specific commands available for EDS analysis within the PPI framework and understand how to seamlessly incorporate EDS data into your automated workflows.
Presentation By:
Michael Stoller
Application Scientist
Nanoscience Instruments
Dominic Dominguez
Application Scientist
Nanoscience Instruments
ON DEMAND
Session 7: ParticleX Automated SEM/EDS
Abstract:
Embark on a journey to mastering ParticleX, the cutting-edge automated SEM/EDS particle analysis solution designed to revolutionize the way you approach material characterization. This masterclass is crafted for anyone who aims to leverage automation for enhanced particle analysis accuracy and efficiency.
Key Highlights of the Masterclass:
Principles of Automation:
• Gain an understanding of the automation processes behind ParticleX: the intricacies of particle detection (thresholds), EDS acquisitions, and the application rules for streamlining analyses
Developing Custom Recipes:
• Learn how to create and apply custom recipes tailored to specific analysis requirements, enabling the automation of routine tasks and ensuring consistent and repeatable results
Reporting Capabilities:
• Discover ParticleX’s detailed reporting features, which allow for the generation of detailed, insightful reports that communicate findings clearly and effectively
Presentation By:
Ben Abraham
Product Manager
Nanoscience Instruments
Mitch Lightner
Application Scientist
Nanoscience Instruments
On Demand
Session 8: Scanning Transmission Electron Microscopy
Abstract:
This masterclass is your gateway to mastering scanning transmission electron microscopy (STEM) on the Phenom Pharos – a field emission desktop SEM. You’ll learn about detection modes, sample preparation, and optimization techniques for high quality imaging.
Key Highlights of the Masterclass:
Understanding detection modes:
• Gain a comprehensive understanding of different STEM detection modes: bright field (BF), dark field (DF), and high angle annular dark field (HAADF)
• Learn how each mode contributes to the visualization of sample features and composition.
Sample Prep Mastery:
• Discover best practices for preparing samples for STEM analysis
• Preserve the integrity and features of samples, ensuring clear and detailed imaging
Image optimization strategies:
• Understand how to adjust various parameters for the clearest, most informative images
Presentation By:
Ingrid Koch
Application Scientist
Nanoscience Instruments
Mitch Lightner
Application Scientist
Nanoscience Instruments
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