Search
Close this search box.
BSD-demo-exampleSED-demo-example
SCANNING TRANSMISSION ELECTRON MICROSCOPY

Electron Detectors

The Phenom Backscattered Electron Detector (BSD) and Phenom Secondary Electron Detector (SED) are responsible for detecting electrons resulting from interactions between the electron beam and sample surface. The two detectors collect different signals that convey varying information about atomic numbers and surface topography.

Fast Imaging

High sensitivity paired with the fastest vent-load cycle provides an average time-to-image of under 40 seconds

Mixed Mode

Built-in signal mixing allows you to simultaneously view BSD and SED signals in a singular composite image

Surface Sensitivity

Topographic imaging using an optional SED, or take advantage of the segmented BSD in topographic mode

Talk to an Instrumentation Specialist Today!

Overview of Phenom Electron Detectors

The Phenom BSD provides high resolution images that convey elemental contrast information. This highly sensitive detector is standard to every Phenom Desktop SEM and is configured to provide fast, high-quality imaging that allows you to readily identify the microstructure of a sample. The detector operates well at any magnification and vacuum level and an optional topographic mode makes use of the four-segment configuration of the sensors to provide qualitative and three-dimensional visualizations of surface topography.

The Phenom SED collects electrons emitted from the sample surface and thus provides crisp and high-resolution surface-sensitive imaging. Images generated with the SED convey surface topographical information and generally have higher resolution as a result of the smaller beam-sample interaction volume. Therefore, SED imaging is a great complement to BSD imaging overall.

Phenom Electron Detectors

Product Features

Compositional imaging mode

The standard backscattered electron detector (BSD) is a four-segment detector that provides high signal-to-noise images with compositional contrast. BSD imaging provides rapid, high-resolution images that reveal a sample’s microstructure in exceptional detail, enabling clear differentiation between regions of varying elemental composition. This versatile imaging mode is valuable across a wide range of applications, from materials science to failure analysis, offering fast and reliable insights into complex sample structures.

Topographic imaging mode

The topographic imaging modes, Topo A and Topo B, enhance surface analysis by displaying the BSE signal difference between the upper/lower and left/right halves of the backscatter detector (BSD). These modes provide a unique way to visualize surface topography, offering qualitative insights into height variations and surface features that may not be apparent in standard BSE images.

Comparison of fuel cell surface images on a Phenom XL Desktop SEM in order from left to right: BSE, Topo A mode, Topo B mode.

3D roughness reconstruction

The 3DRR technique generates a 3D surface map, enabling detailed roughness measurements and advanced surface analysis. By applying a “shape from shading” algorithm, it calculates relative surface heights based on signal variations from the four quadrants of the backscatter detector (BSD). The results are displayed as a heat map, providing more intuitive and detailed topographical information compared to standard grayscale images.

Secondary electron imaging

Secondary electrons provide detailed surface information because they emerge from an interaction volume that is confined near the sample surface. SED images provide excellent topographic contrast at finer resolution than what can be achieved using a BSD.

Phenom Electron Detectors

Product Knowledgebase

Webinar

MAPS 3: Automated Image and EDS Stitching for Phenom SEMs

Take your Scanning Electron Microscopy (SEM) workflows to the next level with MAPS 3, a so…

Blog

Secondary Electrons in SEM: Unlocking Surface Insights at the Nanoscale 

In scanning electron microscopy (SEM), secondary electrons (SE) play a pivotal role in rev…

White Paper

Phenom Pharos: A Compact Desktop STEM for Screening Negative Stained Samples

The Phenom Pharos Desktop SEM/STEM is a compact and affordable solution designed for cryo-…

Want to learn more? Talk to a scientist:

Questions about an instrument? Send us a message!

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.