Phenom Desktop SEM
PSeries Sample Holders
The Phenom P-Series lineup of desktop SEMs is comprised of the Pharos, Pro/ProX, and Pure systems, each compatible with variety of sample holders for highly specialized applications.
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Motorized Tilt & Rotate Sample Holder
The Motorized Tilt & Rotate Sample Holder delivers controlled angular tilting and rotation of the sample stage, allowing for imaging of the same area from multiple angles and improved visualization of three-dimensional structures. This feature is particularly useful for observing the surface topography of samples with complex shapes and structures, such as bond pads or materials with irregular surfaces. With this cordless accessory, user can enhance their imaging capabilities, improve their understanding of complex structures, and gain new insights into the behavior of their samples.
Key Specifications:
- Software Integrated Controls: Easily change tilt and rotation without leaving the image acquisition screen
- Compucentric Rotation: Working distance and Y position are automatically corrected to keep the feature of interest in the field of view
- -10° to 45° Tilt: This range of tilt can help with the inspection of coatings, cross sections, etched surfaces, bond pads, and much more
- 360° Rotation: The stage provides full rotations in step sizes of 0.2 to ensure a high degree precision in sample position
Microtool Sample Holder
The Microtool Sample Holder features an iris style clamp, specially designed for holding long slender samples. Using this holder removed the need for cutting down such samples or cumbersome mounting jigs. As soon as the sample is in place, it can be loaded into the Phenom for imaging. This enables rapid screening and failure analysis of axially shaped objects.
Key Specifications:
- Damage-free Clamping: Quick and non-destructive clamping mechanism, no extra tooling required
- Easy Sample Rotation: Manual tilt and rotation for easy sample positioning
- High Aspect Ratio Samples: Ideal for drill bits, milling tools, and injection needles
- Sample Diameter: 0.5 – 10 mm
- Sample Length: 10 – 100 mm
- Tilt angle: -5° to +40°
- Rotation: -35° to +35°
Temperature Controlled Sample Holder
The Temperature Controlled Sample Holder enables the study of vacuum-sensitive and fragile samples such as biological tissue, food or organic coatings. The Temperature Controlled Sample Holder can control the temperature of the sample, freezing any liquids in place and controlling the humidity around the sample. This minimizes the effect of the electron beam and vacuum damage on the samples.
Product Features
This active sample holder is based on the Peltier principle and designed in a way that the temperature can be adjusted quickly and easily. The sample temperature is accurately monitored and controlled by a dedicated keypad controller. The Temperature Controlled Sample Holder comes in two temperature ranges: -25°C to +50°C and -50°C to +50°C. The standard holder is ideal for imaging plants, mold spores, and beam sensitive materials such as gel capsule pills. The ultra holder is ideal for imaging tissue, fats, gels, sugars, and other highly outgassing and delicate materials.
Key Specifications:
- Standard Holder Temperature Range: -25 °C to +50 °C
- Ultra Holder Temperature Range: -50 °C to +50 °C
- Temperature Accuracy: ±1.5 °C
- Temperature Display Resolution: 0.1 °C
- Maximum Cooling Rate: 20 °C/min
- Sample Size: up to 25 mm diameter and 5 mm height
Electrical Feedthrough Sample Holder
The Electrical Feedthrough Sample Holder enables in situ electrical measurements. The holder has 6 quick release pins that can be used to read or apply voltages and currents to the sample while it is under the SEM column. The feedthrough connector provides a RS323 connector that connects directly to the pins in the holder. This holder is ideal for observation of microelectromechanical systems (MEMS) and other micromicircuitry.
The sample holder is height adjustable from 0 – 25 mm and accommodates 12 mm pin stubs. Max voltage of 50V DC and max current of 1A.
Key Specifications:
- Flexibility and Control: 6 connectors provide design flexibility and full sample control
- Real-time Testing: Image samples in real-time during electrical testing using any SEM imaging mode
Charge Reduction Sample Holder
This sample holder is designed to reduce sample charging and eliminate extra sample preparation of non-conductive samples. With this holder, nonconductive samples can be imaged without a conductive coating applied. This enables easy imaging of materials such as paper, polymers, organic materials, ceramics, glass, and coatings up to 25 mm in diameter and 30 mm in height with the backscatter detector. In addition, the design of the Phenom SEMs columns ensures that using a charge reduction holder does not affect the lifetime of the source while reaching higher magnifications.
Key Specifications:
- Improve Image Quality: Reach higher magnifications without charging the sample
- Avoid Sample Preparation: Uncoated EDS analysis on nonconductive samples
- Maintain SEM Performance: No reduction in source lifetime
- Image Larger Samples: Accommodates samples up to 25 mm in diameter and 30 mm in height
Metallurgical Sample Holder
The Metallurgical Sample Holder is designed to support resin-embedded samples. It comes in two variations – standard and charge reduction, with the option for two sizes of inserts. This holder speeds up SEM analysis for metallurgical samples.
