Linkedin-in Twitter Facebook-f Vimeo-v Instagram Youtube
Search
Close this search box.
Linkedin-in Twitter Facebook-f Vimeo-v Instagram Youtube
Support Portal
Search
Close this search box.
  1. Home
  2. »
  3. Product
  4. »
  5. Phenom Desktop Scanning Electron Microscopes
  6. »
  7. Phenom Pharos Desktop SEM
  8. »
  9. Desktop STEM Detector

Desktop STEM Detector

TFS-Phenom-Pharos-STEM-Detector-Holder.jpg
Thermo Fisher Scientific
PHENOM DESKTOP SEM

Phenom STEM Detector

The Phenom STEM (scanning transmission electron microscopy) detector enables transmission imaging for the Phenom Pharos. STEM imaging offers increased visibility of sample morphology and reveals subsurface structural details at higher resolutions than conventional SEM. 

Download Product Brochure

STEM Imaging

Choose from three standard imaging modes: Bright Field (BF), Dark Field (DF), or High Angle Annular Dark Field (HAADF).

Higher Resolution

With a resolution of <1 nm, STEM achieves a higher resolution than possible with secondary electron detectors.

Application Flexibility

Expand the range of applications accessible to users of any skill level with low-kV STEM imaging on a desktop SEM platform.

Talk to an Instrumentation Specialist Today!

Turnkey Desktop STEM-in-SEM

The small footprint and lower operating vacuum of the Phenom Pharos also provide a faster workflow compared to conventional STEM imaging for applications that do not demand atomic resolution imaging. This new imaging modality provides immense value to a variety of fields including nanomaterials, catalysts, pathology, and batteries.

STEM Imaging Modes:
Bright Field (BF)

BF imaging collects on-axis electrons scattered by the sample. BF image contrast depends primarily on sample thickness and composition, where thicker areas containing heavier elements appear darker. With improved sensitivity to light elements, BF mode can be particularly useful for studying organic samples.

Dark Field (DF)

DF imaging detects off-axis electrons that result from relatively lower diffraction angles. Image contrast depends on thickness and atomic number with brighter areas corresponding to local mass-thickness. DF imaging is more sensitive to atomic number differences in lighter elements, and is useful for a broad range of samples.

High Angle Annular Dark Field (HAADF)

HAADF imaging collects the off-axis signals at the highest scattering angles and is most sensitive to atomic number contrast, or Z contrast. HAADF is particularly sensitive to heavier elements such as metal atoms. This mode can be used to detect features that are harder to visualize with the other imaging modes.

STEM image of negative-stained virus like particles. The image shows two types of VLPs: circular-shaped particles that are approximately 25 nm in size and rod-shaped particle of various lengths. Virus-like particles are self-assembled, non-infectious protein structures that mimic the organization of viral capsids and are commonly used in vaccine development and drug delivery. (Sample courtesy of NYSBC.)
STEM image of negative-stained apoferritin particles. Apoferritin serves as a model protein in cryogenic electron microscopy (cryo-EM) due to its well-defined structure, making it ideal for benchmarking resolution and validating imaging and reconstruction techniques. (Sample courtesy of NYSBC.)
STEM image of negative-stained encapsulin particles. Encapsulin is a protein nanocompartment found in bacteria and archaea, used to encapsulate enzymes or cargo proteins for metabolic or protective functions.
STEM image of negative stained proteasomes. The proteasome is a multi-protein complex that degrades misfolded, damaged, or unneeded proteins into peptides, playing a critical role in cellular protein homeostasis. (Sample courtesy of NYSBC.)
STEM image of negative stained bacteriophage. A broad host range lytic phage is a type of bacteriophage capable of infecting and lysing diverse bacterial species or strains, making it a valuable tool in antibacterial therapy and biocontrol. (Sample courtesy of Ellinor Alseth, Georgia Tech.)
STEM image of negative-stained rotavirus particles. Rotavirus is a highly contagious double-stranded RNA virus that causes severe gastroenteritis, particularly in infants and young children, leading to significant morbidity and mortality worldwide. (Sample courtesy of Penn State University.)
STEM image of negative stained thin section of optic nerve tissue. Large areas of stained tissue can be imaged with sub-nanometer pixel scales through both 8k pixel image acquisition and the utilization of MAPS tiling software. (Sample courtesy of Christine Branter, U Maryland)
STEM image of negative stained kidney tissue section. The Phenom Pharos STEM has been embraced by the pathology community for its ability to produce high-resolution images sufficient to visualize organelles used in diagnostics. Its compatibility with existing sample preparation methods and user-friendly Phenom software significantly streamlines analysis, enhancing both speed and ease of use compared to traditional TEMs. (Sample courtesy of Christine Branter, U Maryland.)
Negative stained kidney tissue section, imaged in STEM mode using the Phenom Pharos. (Sample courtesy of Christine Branter, U Maryland.)
STEM image of negative stained pancreatic tissue section. The organelles relevant to diagnostics are easily visible in this metal stained sample and the fast loading time of the Phenom Pharos improves the throughput of analysis. (Sample courtesy of Christine Branter, U Maryland.)
STEM image of negative stained A1 bacteria. A1 bacteria refer to a group of bacteria classified within the A1 phylogenetic subgroup, often studied for their ecological roles, biochemical activities, or potential applications in biotechnology and environmental science.
STEM image of a graphene-coated TEM grid used for cryo-EM sample preparation. Low-magnification inspection helps identify defective or damaged grids, ensuring only high-quality grids are used for sample deposition.
SEM image of a self-wicking grid, made with platinum nanowires and holey carbon support film for cryo-EM samples. Screening at low magnification prior to sample deposition helps ensure only high quality grids are used for data collection.
A dark field STEM image of a graphene oxide coated grid acquired with automated image mapping (AIM) to provide a large area overview of film coverage consistency.
STEM Detector for Phenom Pharos

Product Features

Integrated STEM Detector and Sample Holder

The sample holder features an integrated detector with 11 segments, offering presets for bright field (BF), dark field (DF), and high-angle annular dark field (HAADF), along with options for custom configurations. Its camera length is optimized for a wide range of applications, including life sciences. This smart design removes the need for cables, as the interface board automatically detects the STEM detector and adjusts to the available imaging conditions.

Easy sample loading

The sample chuck securely holds standard 3-mm TEM grids, which can be loaded into the detector in either orientation. Built for durability, the sample mount is designed to handle frequent sample exchanges and repeated loading and unloading cycles. The stub is optimized with a copper clamp that holds the grids in place, guaranteeing sample flatness and grid protection.

Time to image <40 seconds

After mounting the sample in the stub, the Phenom Desktop STEM fast pump down mechanism and user interface makes it possible to begin imaging in less than one minute. The UI automatically recognizes the STEM detector and instantaneously enables the STEM imaging pane. After selecting your preferred imaging conditions (BF, DF, or HAADF), the detector is read out accordingly and area of interest is imaged with the optimal signal-to-noise ratio.

Expansive imaging area

With the large pixel array detector, you can view nearly the entire sample grid at minimum magnification. This advanced feature offers 200 times more field of view compared to other TEM systems, making it a great solution for quickly screening grid quality and identifying areas of interest.

STEM Detector for Phenom Pharos

Product Knowledgebase

Enhancing Cryo-TEM Efficiency: Screening Negatively Stained Samples with Desktop STEM

Negative Stain imaging is a critical step in the single-particle cryo-EM workflow, allowin…

Learn More

Desktop STEM as a Sample Screening Tool for Cryo-EM

Sample preparation for cryogenic electron microscopy (cryo-EM) can be a demanding and expe…

Learn More

Phenom Pharos: A Compact Desktop STEM for Screening Negative Stained Samples

The Phenom Pharos Desktop SEM/STEM is a compact and affordable solution designed for cryo-…

Learn More
Learn More About the STEM Technique

Want to learn more? Talk to a scientist:

Question?
Quick Links
Our Products
Search
Search
Follow Us
Linkedin-in Twitter Facebook-f Vimeo-v Instagram Youtube

Copyright 2025. Nanoscience Instruments. All Rights Reserved.

Recaptcha | Privacy Policy | Terms & Conditions

Questions about an instrument? Send us a message!

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.