Search
Close this search box.
  1. Home
  2. »
  3. Product
  4. »
  5. Phenom Desktop Scanning Electron Microscopes

Phenom Desktop Scanning Electron Microscopes

Scanning Electron Microscopy

Phenom Desktop SEMs

One of the great revolutions in electron microscopy was the miniaturization of scanning electron microscopes from large floor models to compact desktop models. Desktop SEMs, also called tabletop or benchtop SEMs, retain much of the power and capabilities of floor systems while also introducing a versatility of their own, fitting more easily into lab spaces and providing a suite of specialized software analysis tools. These systems prioritize ease of use and are ideal for in-house analysis at multi-user labs where everyone need not be an SEM specialist.
Bright, long-lifetime CeB6 or FEG electron sources for consistent performance and stability

Speed to Data

High sensitivity detectors paired with the fastest vent/load cycle provides an average time-to-image of under 40 seconds

Intuitive
Operation

Imaging parameters and microscope functions controlled through a clear and navigable user interface

Low Cost of
Ownership

Resilient hardware enables low downtime and infrequent source changes, minimizing the overall maintenance cost

Download the Phenom SEM Product Brochure:

See available Configurations

Phenom Desktop SEM Systems

The Phenom desktop scanning electron microscope from ThermoFisher was designed to be the easiest and most intuitive SEM ever built. Advanced electron sources in the form of cerium hexaboride crystals or field emission guns, along with multiple detectors, make it easy to acquire quality data and beautiful images. Imaging and analysis are mere clicks away!

The Phenom Pharos is uniquely equipped with a field emission gun (FEG) and excels in applications demanding high spatial resolution. An unmatched coherent and bright electron beam, low kV accelerating voltage imaging, and automatic drift corrections make the Pharos a competitive alternative to many floor model SEMs.

The Pharos STEM combines a high-brightness FEG source with a fully-integrated segmented STEM detector to generate STEM images with stunning contrast, even at low voltages. This compact desktop STEM-in-SEM system delivers the precision and resolution of nanoscale imaging traditionally reserved for larger, floor model systems.

The Phenom XL has the largest sample capacity of all Phenom instruments, able to contain a high volume of small specimens, a single bulk mass, or anything in between. The XL also serves as the workhorse for an upgradeable automation software package known as ParticleX to push the boundaries of automated electron microscopy.

The Phenom Pro and ProX are the ultimate all-in-one SEM imaging systems, differentiated only by the presence of an integrated energy dispersive X-ray spectroscopy (EDS) detector. The unique and powerful core architecture characteristic of the Phenom line combines with a host of data analysis features to provide the most complete desktop SEM solution on the market.

The Phenom Pure is an entry-level, economical desktop SEM useful for many different applications, whether it be in teaching environments, simple R&D, or for general imaging. The Pure provides a straightforward imaging solution to visualize sample features, surfaces, and structures and is a user-friendly tool to seamlessly transition from light optical to electron microscopy.

Knowledgebase

SEM Knowledgebase

Webinar

MAPS 3: Automated Image and EDS Stitching for Phenom SEMs

Take your Scanning Electron Microscopy (SEM) workflows to the next level with MAPS 3, a so…

Blog

Secondary Electrons in SEM: Unlocking Surface Insights at the Nanoscale 

In scanning electron microscopy (SEM), secondary electrons (SE) play a pivotal role in rev…

White Paper

Phenom Pharos: A Compact Desktop STEM for Screening Negative Stained Samples

The Phenom Pharos Desktop SEM/STEM is a compact and affordable solution designed for cryo-…

Want to learn more? Talk to a scientist:

Phenom SEM

Phenom Model Comparison

Model:

Phenom Pharos

Phenom XL

Phenom Pro/ProX

Phenom Pure

Specifications
Electron Source Field Emission Gun (FEG) CeB6 crystal CeB6 crystal CeB6 crystal
Max. SEM Magnification 2,000,000x 200,000x 350,000x 175,000x
SEM Resolution – BSD 3 nm 10 nm 8 nm 15 nm
SEM Resolution – SED <2 nm 10 nm 6 nm 15 nm
Acceleration Voltages 1 – 20 kV 5 – 20 kV 5 – 20 kV 5 kV or 10 kV
Navigation Camera
Sample Handling Single pin stub
25 mm diameter
Up to 36 pin stubs
100 mm x 100 mm
Single pin stub
25 mm diameter
Single pin stub
25 mm diameter
Detectors BSD – Four-quadrant backscattered electron detector (standard)
SED – Everhart-Thornley secondary electron detector (optional)
EDS/EDX – Integrated energy dispersive x-ray spectrometer (optional)
STEM Detector

Questions about an instrument? Send us a message!

This site is protected by reCAPTCHA and the Google Privacy Policy and Terms of Service apply.