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Technology: Scanning Electron Microscopy

Particle Analysis Techniques: What Makes SEM Unique

Particle analysis involves measuring various characteristics of powders or particulates, including size, shape, and composition. A wide variety of industries rely on particle analysis for…


Posted: February 19, 2025 | Technology: Scanning Electron Microscopy

Large-area Mapping Workflows in Scanning Electron Microscopy (SEM)

Large-area imaging in scanning electron microscopy (SEM) is a technique for exploring expansive regions of a sample at high resolution, making it invaluable in fields…


Posted: January 23, 2025 | Technology: Scanning Electron Microscopy

SEM Characterization of Recycled Materials for the Circular Economy 

In the age of climate change and resource depletion, the circular economy is increasingly gaining attention. It promotes the reuse, recycling, and repurposing of materials…


Posted: November 6, 2024 | Technology: Scanning Electron Microscopy

ChemiSEM: Streamlining Real-Time Particle Analysis and Decision Making 

Energy dispersive spectroscopy (EDS) is a microanalysis technique that provides localized elemental composition data, typically used in conjunction with scanning electron microscopy (SEM). While SEM-EDS…


Posted: October 30, 2024 | Technology: Scanning Electron Microscopy

Unlocking the Power of Energy Dispersive X-Ray Spectroscopy (EDS) with Scanning Electron Microscopy (SEM) 

The ability to precisely analyze a material’s structure and composition at the microscopic scale is essential for advancing research and innovation. Scanning electron microscopy (SEM)…


Posted: October 23, 2024 | Technology: Scanning Electron Microscopy

Secondary Electrons in SEM: Unlocking Surface Insights at the Nanoscale 

In scanning electron microscopy (SEM), secondary electrons (SE) play a pivotal role in revealing the surface details of materials at the nanoscale. Understanding what secondary…


Posted: October 16, 2024 | Technology: Scanning Electron Microscopy

A Closer Look at Backscattered Electrons in Scanning Electron Microscopy (SEM) Imaging

Materials scientists leverage a range of advanced analytical techniques to extract detailed information regarding a sample’s structure, properties, and defects. Scanning electron microscopy (SEM) is…


Posted: October 9, 2024 | Technology: Scanning Electron Microscopy

Unlocking New Dimensions: 3D Surface Visualization with Scanning Electron Microscopy

Scanning electron microscopy (SEM) has long been a cornerstone in material science, biology, and engineering for its ability to provide high-resolution images of a sample’s…


Posted: October 2, 2024 | Technology: Scanning Electron Microscopy

From Surface to Depth: How Accelerating Voltage Affects SEM Imaging 

Scanning Electron Microscopy (SEM) is a powerful imaging technique that allows for the observation of the surface details of a sample at very high magnifications….


Posted: September 18, 2024 | Technology: Scanning Electron Microscopy

ChemiPhase for Efficient Mapping of Mineral Phases in Geological Samples 

Geological samples are complex matrices of minerals, each with their own unique compositions and structures. Phase identification, in a general sense, is the process of…


Posted: September 4, 2024 | Technology: Scanning Electron Microscopy

The Significance of Beam Intensity in Scanning Electron Microscopy (SEM) Imaging 

Scanning Electron Microscopy (SEM) is an indispensable tool in various scientific and industrial fields, providing high-resolution images of sample surfaces. Among the numerous parameters that…


Posted: August 21, 2024 | Technology: Scanning Electron Microscopy

ChemiSEM: Simultaneous Acquisition of Morphological and Compositional Data 

In a scanning electron microscope (SEM) with Energy Dispersive X-ray Spectroscopy (EDS), a sample’s elemental composition is identified via the X-rays emitted during the electron…


Posted: July 24, 2024 | Technology: Scanning Electron Microscopy

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