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A scanning electron microscope (SEM) is capable of visualizing compositional heterogeneity on the surface of a sample by employing a backscattered electron detector (BSD). A…
Posted: May 22, 2024 | Technology: Scanning Electron Microscopy
Scanning Electron Microscopy (SEM) generates high-resolution images by scanning a focused beam of electrons across the sample surface and detecting the signals produced through beam-sample…
Posted: May 8, 2024 | Technology: Scanning Electron Microscopy
Technical cleanliness is an analytical standard to determine the level of particulate contamination on machined parts. The goal of technical cleanliness is to characterize the…
Posted: May 2, 2024 | Technology: Scanning Electron Microscopy
Charging is one of the most common issues when imaging non-conductive samples by scanning electron microscope (SEM) as it can distort images and damage the…
Posted: April 24, 2024 | Technology: Scanning Electron Microscopy
One of the most common challenges when analyzing non-conductive samples with a scanning electron microscope (SEM) is the charging effect. Without a conductive path, the…
Posted: April 18, 2024 | Technology: Scanning Electron Microscopy
Integrating the ability to perform high-resolution imaging and compositional analysis of materials into any laboratory becomes simplified with a desktop scanning electron microscope (SEM). In…
Posted: April 10, 2024 | Technology: Scanning Electron Microscopy
When acquiring a new scanning electron microscope (SEM), it can be challenging to identify a solution that not only delivers exceptional performance but also remains…
Posted: April 5, 2024 | Technology: Scanning Electron Microscopy
Precision manufacturing is a process that emphasizes exact specifications and extremely tight tolerances within fabricated components. Within this domain, the term technical cleanliness (TC) refers…
Posted: March 27, 2024 | Technology: Scanning Electron Microscopy
Scanning electron microscopy (SEM) is an essential tool that allows scientists to directly visualize the surface structure and composition of a variety of materials on…
Posted: March 13, 2024 | Technology: Scanning Electron Microscopy
Microscopes have revolutionized our ability to observe and analyze the microscopic world with unprecedented detail. By enlarging our view of objects, or magnifying them, microscopes…
Posted: February 28, 2024 | Technology: Scanning Electron Microscopy
In the evolving landscape of pharmaceutical research and development, the goal to understand the micro and nanoscale properties of therapeutics is vital. Central to this…
Posted: February 14, 2024 | Technology: Scanning Electron Microscopy
The electron source is one of the most critical components of a scanning electron microscope (SEM) because it determines the quality, brightness, and size of…
Posted: January 31, 2024 | Technology: Scanning Electron Microscopy
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