Phenom SEM User Guide Series

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Episode 1: How to Load a Sample on a Phenom SEM Part 1

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Mounting samples properly is key to quality SEM results. In this episode of our Phenom Scanning Electron Microscope User Series, learn the standard process for mounting samples on aluminum stubs. We also discuss specialty stub options like the 45-90 degree stub for imaging cross-sections and the variable tilt stub for capturing multiple sample angles.

Episode 2: How to Load a Sample on a Phenom SEM Part 2

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Proper sample preparation is key for quality scanning electron microscopy imaging. In this video, we demonstrate gold sputter coating, an essential technique to combat electron buildup on samples. By applying a nanometer-thin layer of gold, we can mitigate the charging effect that leads to poor signal-to-noise ratios. Learn how this simple coating procedure can drastically improve your SEM images by reducing noise and artifacts from improper sample prep.

Episode 3: How to Navigate Samples

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In this tutorial in our Phenom Scanning Electron Microscope User Series, we’ll introduce you to the key tools used to operate a Phenom XL desktop SEM. Including the stage, zoom, optical camera controls, and how to save x-y coordinate positions, which can help you quickly navigate to specific areas of your sample for further analysis.

Episode 4: How to Optimize SEM Images Part 1

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In this episode of our Phenom Scanning Electron Microscope User Series, we’ll guide you through a tutorial on the essential controls used to optimize SEM images, including focus, brightness, and contrast. These controls can significantly impact the quality of SEM images, and understanding how to use them is essential for obtaining accurate and meaningful data.

Episode 5: How to Optimize SEM Images Part 2

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In this episode of our Phenom Scanning Electron Microscope User Series, we’ll demonstrate advanced techniques to optimize your SEM images on a Phenom XL desktop SEM. This tutorial covers the concepts of stigmation, and source tilt to achieve clearer images with higher contrast and resolution.

Episode 6: Exploring Electron Beam Settings

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In this episode of our Phenom Scanning Electron Microscope User Series, we’ll guide you through the essential concepts of beam accelerating voltages, and beam intensities (currents) of 5 kV, 10 kV, and 15 kV settings. We’ll also show how to apply these settings for optimal results in SEM imaging in this tutorial.

Episode 7: Detector Options

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In this episode of our Phenom Scanning Electron Microscope User Series, we will discuss the detector options of the Phenom XL desktop SEM. This tutorial will show backscattered detector, secondary electron detector, and mixed mode settings for optimizing your SEM images.

Episode 8: How to Enhance EDS

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In this episode of our Phenom Scanning Electron Microscope User Series, we’ll explore energy dispersive spectroscopy (EDS) on the Phenom desktop SEM. This tutorial will cover beam settings, EDS analysis, spot, region, linescan, and mapping for this technique. We’ll also demonstrate how to generate a report and interpret the data from your samples.

Episode 9: ParticleMetric Analytics

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In this episode of our Phenom Scanning Electron Microscope User Series, you’ll experience an in-depth particle analysis workflow with ParticleMetric, the integrated Phenom software tool for identifying particles and recording vast amounts of dimensional data. This tutorial will show how scatter plots and histograms can help organize and characterize hundreds of particles from SEM images.

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