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Mounting samples properly is key to quality SEM results. In this episode of our Phenom Scanning Electron Microscope User Series, learn the standard process for mounting samples on aluminum stubs. We also discuss specialty stub options like the 45-90 degree stub for imaging cross-sections and the variable tilt stub for capturing multiple sample angles.
Proper sample preparation is key for quality scanning electron microscopy imaging. In this video, we demonstrate gold sputter coating, an essential technique to combat electron buildup on samples. By applying a nanometer-thin layer of gold, we can mitigate the charging effect that leads to poor signal-to-noise ratios. Learn how this simple coating procedure can drastically improve your SEM images by reducing noise and artifacts from improper sample prep.