Maintaining technical cleanliness is critical in industries where contamination can compromise product performance, safety, and compliance. From automotive and aerospace to medical devices and microelectronics, stringent cleanliness standards help mitigate the risks associated with particulate contamination.
Traditional analysis methods, such as optical microscopy and particle counters, can be limited in their ability to characterize particles with high accuracy. Scanning Electron Microscopy (SEM) with Energy Dispersive X-Ray Spectroscopy (EDS or EDX) provides a more comprehensive approach, enabling precise identification of particle composition and morphology.
Join us on April 17th for a webinar in which we will explore how the Phenom ParticleX Automated SEM with EDS analysis improves efficiency and reliability in cleanliness verification.
Our Automated SEM Product Manager, Ben Abraham, will discuss:
- The significance of technical cleanliness and common contamination sources
- Using the ParticleX Automated SEM to address industry standards, including ISO 16232, VDA 19.1, ISO 14644, and ISO 4407
- How SEM/EDS enhances cleanliness analysis, from manual to automated workflows with ParticleX
- Advances in ParticleX reporting, including VDA 19.1 updates and standard reports for ISO 16232 and ISO 4407
